- Alam, M.A. and Mahapatra, S., 2005. A comprehensive model of PMOS NBTI degradation. Microelectronics Reliability, 45(1), pp.71-81.
- Huard, V., Angot, D. and Cacho, F., 2015, April. From bti variability to product failure rate: A technology scaling perspective. In 2015 IEEE International Reliability Physics Symposium (pp. 6B-3). IEEE.
- M. van Santen, J. Martin-Martinez, H. Amrouch, M. M. Nafria and J. Henkel, "Reliability in Super- and Near-Threshold Computing: A Unified Model of RTN, BTI, and PV," in IEEE Transactions on Circuits and Systems I: Regular Papers, vol. 65, no. 1, pp. 293-306, Jan. 2018, doi: 10.1109/TCSI.2017.2717790..
- Jafari, A., Raji, M. and Ghavami, B., 2020. Timing Reliability Improvement of Master-Slave Flip-Flops in the Presence of Aging Effects. IEEE Transactions on Circuits and Systems I: Regular Papers, 67(12),4761-4773.
- Fang, J. and Sapatnekar, S.S., 2013. The impact of BTI variations on timing in digital logic circuits. IEEE Transactions on Device and Materials Reliability, 13(1), pp.277-286.
- Diaz-Fortuny, Javier, Mahdi Benkhelifa, Alexander Grill, Erik Bury, Robin Degraeve, Ben Kaczer, and Hussam Amrouch. "Investigation of Cryogenic Aging in 28 nm CMOS: Suppression of BTI and HCD in Circuits and SRAM." In 2025 IEEE International Reliability Physics Symposium (IRPS), pp. 1-7. IEEE, 2025
- Sharma, M., Khanna, V., Tonk, A. and Ruhil, S., 2025. Implementation and Comparative Analysis of Various Low Power FSM Synthesis Techniques. Journal of Electronics and Power Engineering (JEPE), vol. 2, no. 1, pp.54-66.
- Choudhury M, Gao M, Varna A, Peer E, Forte D. TRANSPOSE: Transitional Approaches for Spatially-Aware LFI Resilient FSM Encoding. arXiv preprint arXiv:2411.02798. 2024 Nov 5.
- Babakov, R.M. and Barkalov, A.A., 2025. An Algorithm for Solving the Problem of Algebraic Synthesis of a Finite-State Machine with Datapath of Transitions Based on a Matrix Approach. Cybernetics and Systems Analysis, pp.1-7.
- Barkalov, Alexander, Larysa Titarenko, and Kamil Mielcarek. "Transforming Group Codes in Mealy Finite State Machines with Composite State Codes." Applied Sciences 15, no. 8 (2025): 4289.
- Al Jassani, B.A., Urquhart, N. and Almaini, A.E.A., 2011. State assignment for sequential circuits using multi-objective genetic algorithm. IET computers & digital techniques, 5(4), pp.296-305.
- El-Maleh, A.H., Sheikh, A.T. and Sait, S.M., 2013. Binary particle swarm optimization (BPSO) based state assignment for area minimization of sequential circuits. Applied soft computing, 13(12), pp.4832-4840.
- El-Maleh, A.H., 2015. Majority-based evolution state assignment algorithm for area and power optimisation of sequential circuits. IET Computers & Digital Techniques, 10(1), pp.30-36.
- Tao, Y., Zhang, Y. and Wang, Q., 2018. Fuzzy c-mean clustering-based decomposition with GA optimizer for FSM synthesis targeting to low power. Engineering Applications of Artificial Intelligence, 68, pp.40-52.
- Tao, Y., Zhang, Y., Wang, Q. and Cao, J., 2018. MPGA: an evolutionary state assignment for dynamic and leakage power reduction in FSM synthesis. IET Computers & Digital Techniques, 12(3), pp.111-120.
- Pendyala, S. and Katkoori, S., 2016, March. State encoding based NBTI optimization in finite state machines. In 2016 17th International Symposium on Quality Electronic Design (ISQED) (pp. 416-422). IEEE.
- Amrouch, H., van Santen, V.M. and Henkel, J., 2016. Interdependencies of degradation effects and their impact on computing. IEEE Design & Test, 34(3),59-67.
- Mukhopadhyay, S., Goel, N. and Mahapatra, S., 2016. A comparative study of NBTI and PBTI using different experimental techniques. IEEE Transactions on Electron Devices, 63(10),4038-4045.
- Sexton, R.S., Dorsey, R.E. and Johnson, J.D., 1999. Optimization of neural networks: A comparative analysis of the genetic algorithm and simulated annealing. European Journal of Operational Research, 114(3),589-601.
- Zafar, S., Kumar, A., Gusev, E. and Cartier, E., 2005. Threshold voltage instabilities in high-/spl kappa/gate dielectric stacks. IEEE Transactions on Device and Materials Reliability, 5(1),45-64.
- Tudor, B., Wang, J., Chen, Z., Tan, R., Liu, W. and Lee, F., 2012. An accurate MOSFET aging model for 28 nm integrated circuit simulation. Microelectronics Reliability, 52(8),1565-1570.
- Yang, H.I., Yang, S.C., Hwang, W. and Chuang, C.T., 2011. Impacts of NBTI/PBTI on timing control circuits and degradation tolerant design in nanoscale CMOS SRAM. IEEE Transactions on Circuits and Systems I: Regular Papers, 58(6),1239-1251.
- Wenping Wang, Zile Wei, Shengqi Yang and Yu Cao, "An efficient method to identify critical gates under circuit aging," 2007 IEEE/ACM International Conference on Computer-Aided Design, 2007, pp. 735-740, doi: 10.1109/ICCAD.2007.4397353
- Gomez, and V.Champac, “An efficient metric-guided gate sizing methodology for guardband reduction under process variations and aging effects,” Journal of Electronic Testing, vol. 35, No. 1, pp. 87-100, 2019.
- Raji, M., Mahmoudi, R., Ghavami, B. and Keshavarzi, S., 2021. Lifetime Reliability Improvement of Nano-Scale Digital Circuits Using Dual Threshold Voltage Assignment. IEEE Access, 9, pp.114120-114134.
- Wang, W., Reddy, V., Yang, B., Balakrishnan, V., Krishnan, S. and Cao, Y., 2008, September. Statistical prediction of circuit aging under process variations. In 2008 IEEE Custom Integrated Circuits Conference(pp. 13-16). IEEE.
- Blaauw, D., Chopra, K., Srivastava, A. and Scheffer, L., 2008. Statistical timing analysis: From basic principles to state of the art. IEEE transactions on computer-aided design of integrated circuits and systems, 27(4),589-607.
- Papoulis, A. and Pillai, S.U., 2002. Probability, random variables, and stochastic processes. Tata McGraw-Hill Education.
- Goldberg, D.E., 1989. Genetic algorithms in search, optimization, and machine learning. Reading.
- http://www.pld.ttu.ee/applets/dsa/Libs/sis/
- https://people.eecs.berkeley.edu/~alanmi/abc/
- http://ptm.asu.edu/
- Agarwal, A., Blaauw, D. and Zolotov, V., 2003, November. Statistical timing analysis for intra-die process variations with spatial correlations. In ICCAD-2003. International Conference on Computer Aided Design (IEEE Cat. No. 03CH37486)(pp. 900-907). IEEE.
- Pendyala, S. and Katkoori, S., 2016, March. State encoding based NBTI optimization in finite state machines. In 2016 17th International Symposium on Quality Electronic Design (ISQED)(pp. 416-422). IEEE.
- Zizheng Guo, Tsung-Wei Huang, and Yibo Lin. 2020. GPU-accelerated static timing analysis. In Proceedings of the 39th International Conference on Computer-Aided Design (ICCAD '20), 2020, pp. 1–9.
- Ercolani, M. Favalli, M. Damiani, P. Olivo, and B. Ricco, “Estimate of signal probability in combinational logic networks,” in [1989] Proceedings of the 1st European Test Conference, 1989, pp. 132–138.
- Davidson, “ITC’99 benchmark circuits-preliminary results,” in International Test Conference 1999. Proceedings (IEEE Cat. No. 99CH37034), pp. 1125–1125, IEEE, 1999.
|