دانشگاه سمنان

 آمار

تعداد نشریات21
تعداد شماره‌ها610
تعداد مقالات9,026
تعداد مشاهده مقاله67,082,717
تعداد دریافت فایل اصل مقاله7,656,151
Daraee, Maryam, Sadegh Hassani, Sedigheh, Jalilzadeh Azar, Somayeh. (1402). An overview of determination of Young’s modulus by AFM in various fields. نشریه هنرهای کاربردی, 1(1), -. doi: 10.22075/jpetk.2024.27737.1011
Maryam Daraee; Sedigheh Sadegh Hassani; Somayeh Jalilzadeh Azar. "An overview of determination of Young’s modulus by AFM in various fields". نشریه هنرهای کاربردی, 1, 1, 1402, -. doi: 10.22075/jpetk.2024.27737.1011
Daraee, Maryam, Sadegh Hassani, Sedigheh, Jalilzadeh Azar, Somayeh. (1402). 'An overview of determination of Young’s modulus by AFM in various fields', نشریه هنرهای کاربردی, 1(1), pp. -. doi: 10.22075/jpetk.2024.27737.1011
Daraee, Maryam, Sadegh Hassani, Sedigheh, Jalilzadeh Azar, Somayeh. An overview of determination of Young’s modulus by AFM in various fields. نشریه هنرهای کاربردی, 1402; 1(1): -. doi: 10.22075/jpetk.2024.27737.1011

An overview of determination of Young’s modulus by AFM in various fields

Progress in Engineering Thermodynamics and Kinetics
دوره 1، شماره 1، اردیبهشت 2024    اصل مقاله (1.13 M)
نوع مقاله: Original Article
شناسه دیجیتال (DOI): 10.22075/jpetk.2024.27737.1011
نویسندگان
Maryam Daraee* 1؛ Sedigheh Sadegh Hassani2؛ Somayeh Jalilzadeh Azar3
1Nano Compound Semnan Dara Company, Mahdishahr, Semnan, Iran
2Catalysis Research Division, Research Institute of Petroleum Industry (RIPI), Tehran, Iran
3M.Sc.Microbiology, Chemistry & Chemical Engineering Research Center of Iran, Tehran, Iran
تاریخ دریافت: 16 تیر 1401،  تاریخ بازنگری: 23 بهمن 1402،  تاریخ پذیرش: 01 اسفند 1402 
چکیده
The Atomic Force Microscope (AFM) is a powerful tool for studying the properties and structures of materials at the nanometer scale. Unlike most surface analysis methods, it has no restrictions on surface types or their environment. This versatility allows AFM to investigate a wide range of materials, including conductive, insulating, soft, hard, cohesive, powdered, biological, organic, and inorganic. As such, it finds applications in diverse scientific fields such as chemistry, surface chemistry, polymer science, physics, molecular engineering, semiconductor science, biology, and medicine. Beyond its ability to image surfaces, AFM can also measure mechanical properties like Young's modulus. Young's modulus, also known as the modulus of elasticity (E), is defined as the ratio of stress to strain in the elastic region. This value reflects the stiffness of a material and changes with temperature. This paper explores the application of AFM in measuring Young's modulus across various scientific disciplines.
کلیدواژه‌ها
Atomic force microscope؛ Young' s modulus؛ Force curve؛ Elasticity؛ Stress؛ Strain
آمار
تعداد مشاهده مقاله: 84
تعداد دریافت فایل اصل مقاله: 375


سامانه مدیریت نشریات علمی. قدرت گرفته از سیناوب