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Preparation of Indian Reference Material for the calibration of Powder X-ray Diffractometer: α-Alumina | ||
| Progress in Physics of Applied Materials | ||
| دوره 3، شماره 1 - شماره پیاپی 4، بهمن 2023، صفحه 57-65 اصل مقاله (871.5 K) | ||
| نوع مقاله: Original Article | ||
| شناسه دیجیتال (DOI): 10.22075/ppam.2023.31242.1059 | ||
| نویسندگان | ||
| Naghma Khan1، 2؛ N. Vijayan* 1، 2؛ Ravinder Kumar1، 3؛ Neha Gupta4؛ R.P. Pant2 | ||
| 1Academy of Scientific and Innovative Research (AcSIR), Ghaziabad- 201 002, India | ||
| 2CSIR-National Physical Laboratory, Dr. K.S. Krishnan Road, New Delhi – 110 012, India | ||
| 3Central Research Facility, Indian Institute of Technology Delhi, Hauz Khas, New Delhi 110016, India | ||
| 4Lajpat Rai College, Sahibabad, Ghaziabad -Uttar Pradesh- 201005, India | ||
| تاریخ دریافت: 21 تیر 1402، تاریخ بازنگری: 12 شهریور 1402، تاریخ پذیرش: 13 شهریور 1402 | ||
| چکیده | ||
| The CSIR- National Physical Laboratory of India (NPLI) constantly prepares and disseminates Indian Reference Materials (Bharatiya Nirdeshak Dravya; BND®) in various areas. Recently, NPLI has prepared the Indian Reference Material (IRM) of α-Alumina to calibrate the Powder X-Ray Diffractometer (PXRD). In this report, the preparation and certification procedure of α-Alumina (BND 2001) has been examined as an Indian Reference Material that can be utilized as the primary standard for powder X-ray diffraction instruments. The developed IRM was utilized to calibrate PXRD for phase purity. The stability of the prepared α-alumina was studied by using powder X-ray diffractometer. The homogeneity and the particle size of the material were characterized by using scanning electron microscopy. The repeatability of the preparation and pertinent characterization were affirmed using different calibrated instruments. The phase purity of the material was verified by performing a round-robin test, and the related uncertainty estimations were reported in the paper. | ||
| کلیدواژهها | ||
| Bharatiya Nirdeshak Dravya (BND®)؛ powder X-Ray diffraction؛ intensity calibration؛ uncertainty calculation؛ certification | ||
| مراجع | ||
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[1] W. S. K. Bong, I. Nakai, S. Furuya, H. Suzuki, Y. Abe, K. Osaka, T. Matsumoto, M. Itou, N. Imai, T. Ninomiya, "Development of heavy mineral and heavy element database of soil sediments in Japan using synchrotron radiation X-ray powder diffraction and high-energy (116 keV) X-ray fluorescence analysis." International Science Internships 220(2012) 33–49. [2] M. Cabral, F. Margarido, C.A. Nogueira, "Characterization of Spent Ni-MH Batteries." In Materials Science Forum 730 (2012) 569–574. [3] R. Das, M. Ali, S.B. Abd Hamid, "Current Applications of X-Ray Powder Diffraction - A Review." Reviews on Advanced Materials Science 38 (2014) 95–109. [4] A. Menditto, M. Patriarca, B. Magnusson, "Understand in the Meaning of Accuracy, Trueness and Precision." Accreditation and quality assurance 12 (2007) 45–47. [5] W.M. Stallings, G.M. Gillmore, "A Note on ‘‘Accuracy’’ and ‘‘Precision’’." Journal of Educational Measurement 8 (1971) 127–129. [6] N. Khan, R. Kumar, R. P. Pant, N. Vijayan, "Necessity of Reference Materials for Powder X-ray Diffractometer." IACG News Letter 31 (2019) 21-22. [7] N. Khan, N. Vijayan, R. Kumar, R.P. Pant, "Necessity of Reference Material for Powder X-ray Diffractometer." Samiksha Published by CSIR-NPL, Under Press, (2020). [8] F.M. de Albano, C.S. ten Caten, "Proficiency Tests for Laboratories: A Systematic Review." Accred. Qual. Assur. 19 (2014) 245–257. [9] F. de Medeiros Albano, C.S. ten Caten, "Analysis of the Relationships between Proficiency Testing, Validation of Methods and Estimation of Measurement Uncertainty: A Qualitative Study with Experts." Accred. Qual. Assur. 21 (2016) 161–166. [10] M. Rutkowska, J. Namies´nik, P. Konieczka, "Production of certified reference materials – homogeneity and stability study based on the determination of total mercury and methyl mercury." Microchemical Journal 153 (2020) 104338. [11] C. R. Hubbard, "Certification of Si powder diffraction standard reference material 640a." Journal of Applied Crystallography 16 (1983) 285-288. [12] R. L. Snyder, "The Use of Reference Intensity Ratios in X-Ray Quantitative Analysis." Powder diffraction 7 (1992) 186-193. [13] C. Legros, C. Carry, P. Bowen, H. Hofmann, "Sintering of a transition alumina: effects of phase transformation, powder characteristics and thermal cycle." Journal of the European Ceramic Society 19 (1999) 1967–1978. [14] S. Lamouria, M. Hamidouche, N. Bouaouadja, H. Belhoucheta, V. Garnier, G. Fantozzi, J. F. Trelkat, "Control of the aluminatoalumina phase transformation for an optimized alumina densification." Boletin De La Sociedad Espanola De Ceramic Y Vidrio 56 (2017) 47-54. [15] A. P. Amrute, K. Jeske, Z. Lodziana, G. Prieto, F. Schuth, "Hydrothermal Stability of High-Surface-Area α‑Al2O3 and Its Use as a Support for Hydrothermally Stable Fischer−Tropsch Synthesis Catalysts." Chemistry of Materials 32 (2020) 4369−4374. [16] K. A. Matori, L. C. Wah, M. Hashim, I. Ismail, M. Hafiz M. Zaid, "Phase Transformations of α-Alumina Made from Waste Aluminum via a Precipitation Technique." International journal of molecular sciences 13 (2012) 16812-16821. [17] seven orgonlzatiarls Supportedthe, Thefollowing. "Guide to the Expression of Uncertainty in Measurement; (GUM 1995 with Minor Corrections)." Joint Committee for Guides in Metrology (JCGM) (2008). [18] H. M. Rietveld, "Line Profiles of Neutron Powder-Diffraction Peaks for Structure Refinement." Acta Crystallographica 22 (1967) 151–152. [19] H. M. Rietveld, "A Profile Refinement Method for Nuclear and Magnetic Structures." Journal of applied Crystallography 2(1969) 65–71. [20] P. Paufler, R. A. Young (ed.). "The Rietveld Method. International Union of Crystallography." Oxford University Press 1993 30 (2006) 494-494. [21] J.P. Cline, R. B. Von Dreele, R. Winburn, P. W. Stephens, J. J. Filliben, "Addressing the amorphous content issue in quantitative phase analysis: the certification of NIST standard reference material 676a." Acta Crystallographica Section A: Foundations of Crystallography 67(2011) 357-367. [22] T. P. J. Linsinger, J. Pauwels, A. Lamberty, H. G. Schimmel, A. M. H. van der Veen, L. Siekmann, "Estimating the uncertainty of stability for matrix CRMs." Fresenius journal of analytical chemistry 370(2001) 183–188. [23] V. P. Gavrilenko, M. A. Ermakova, A. V. Zablotskii, A. Yu. Kuzin, P. A. Todua, M. N. Filippov, "An Estimate of the Uncertainty of Measurements of Lattice Spacings in Silicon Single Crystals Using a Laboratory X-Ray Diffractometer." Measurement Techniques 56 (2014) 1339–1342. [24] M. F. de Campos, J. C. Damasceno, R. Machado, C. A. Achete, "Uncertainty Estimation of Lattice Parameters Measured by X-ray Diffraction, XVIII IMEKO World Congress Metrology for a Sustainable Development September, (2006) 17 – 22. [25] D. K. Aswal, "Metrology for Inclusive Growth of India." (2020) 956-950. . | ||
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