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Preparation of Indian Reference Material for the calibration of Powder X-ray Diffractometer: α-Alumina | ||
| Progress in Physics of Applied Materials | ||
| دوره 3، شماره 1 - شماره پیاپی 4، بهمن 2023، صفحه 57-65 اصل مقاله (871.5 K) | ||
| نوع مقاله: Original Article | ||
| شناسه دیجیتال (DOI): 10.22075/ppam.2023.31242.1059 | ||
| نویسندگان | ||
| Naghma Khan1، 2؛ N. Vijayan* 1، 2؛ Ravinder Kumar1، 3؛ Neha Gupta4؛ R.P. Pant2 | ||
| 1Academy of Scientific and Innovative Research (AcSIR), Ghaziabad- 201 002, India | ||
| 2CSIR-National Physical Laboratory, Dr. K.S. Krishnan Road, New Delhi – 110 012, India | ||
| 3Central Research Facility, Indian Institute of Technology Delhi, Hauz Khas, New Delhi 110016, India | ||
| 4Lajpat Rai College, Sahibabad, Ghaziabad -Uttar Pradesh- 201005, India | ||
| تاریخ دریافت: 21 تیر 1402، تاریخ بازنگری: 12 شهریور 1402، تاریخ پذیرش: 13 شهریور 1402 | ||
| چکیده | ||
| The CSIR- National Physical Laboratory of India (NPLI) constantly prepares and disseminates Indian Reference Materials (Bharatiya Nirdeshak Dravya; BND®) in various areas. Recently, NPLI has prepared the Indian Reference Material (IRM) of α-Alumina to calibrate the Powder X-Ray Diffractometer (PXRD). In this report, the preparation and certification procedure of α-Alumina (BND 2001) has been examined as an Indian Reference Material that can be utilized as the primary standard for powder X-ray diffraction instruments. The developed IRM was utilized to calibrate PXRD for phase purity. The stability of the prepared α-alumina was studied by using powder X-ray diffractometer. The homogeneity and the particle size of the material were characterized by using scanning electron microscopy. The repeatability of the preparation and pertinent characterization were affirmed using different calibrated instruments. The phase purity of the material was verified by performing a round-robin test, and the related uncertainty estimations were reported in the paper. | ||
| کلیدواژه‌ها | ||
| Bharatiya Nirdeshak Dravya (BND®)؛ powder X-Ray diffraction؛ intensity calibration؛ uncertainty calculation؛ certification | ||
| مراجع | ||
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